Basic Properties:
Density (g/cm3) | 5.4 | Melting Point (°C) | 1875 |
Refractive Index at Peak Emission | 1.95 | Emission Peak (nm) | 370 |
Emission Spectral Range (nm) | 325-425 | Decay Time (ns) | 40 |
Light Output (photons/KeV) | 18 | Radiation Length (cm) | 2.7 |
Hygroscopic | None | Cleavage Plane | None |
Specifications:
Growth Method | Czochralsk | Formula | YAlO3(cerium content: 0.2~1.2 at%) |
Maximum Dimension | ∅ 50 mm x 160 mm | Available Items | Single crystal |
Metal Coating | Al, Au, Ag etc. | Protective Coating | SiO2 |
Cerium doped yttrium aluminum (or Ce: YAP) crystals are fast scintillating material, with a decay time of 40ns. YAP(Ce) crystal is mechanically strong and chemically inert, suitable for precise mechanical fabrications. A fragile aluminum layer film could be deposited on the entrance surface to avoid the light-sensitivity. YAP(Ce) can be well suited for imagining applications due to its ultra-low energy secondary X-ray emissions. Ce: YAP detectors are widely used in gamma and X-ray counting, electron microscopy, electron and X-ray imaging screens, and computer tomography (CT) systems.
Hangzhou Shalom EO offers the YAP(Ce) single crystals upon the customer's requirement; the maximum size available is ∅ 50 mm x 160 mm, and it is grown by the Czochralski method with a cerium concentration of 0.2~1.2at%. Besides the general cylindrical or rectangular-shaped YAP(Ce) crystals, Shalom EO also provides the YAP(Ce) thin screen for soft X-ray high-resolution imaging applications.
Application Notes: